Published in Acta Materialia, 2022

Recommended citation: S. Stangebye, Y. Zhang, S. Gupta, T. Zhu, O. Pierron, J. Kacher*, "Understanding and quantifying electron beam effects during in situ TEM nanomechanical tensile testing on metal thin films." Acta Materialia, 222, 117441 (2022). https://www.sciencedirect.com/science/article/pii/S135964542100820X